15 Investigation of Electronic Speckle Pattern Interferometry with Line Laser Scanning for Large Area Deformation Measurement 95 specimen was measured. Speckle images for each vertical position were captured at the initial and the deformed state. Analyzed mismatch phases were corrected and integrated. As the result, accurate laser scanning could be performed. The continuous phase distribution was obtained by the image integration with the phase correction. Therefore, the proposed method is effective. Additionally, for increasing the scanning steps, speeding up the measurement process by an automation is necessary. Reference 1. Chiang, F.P.: Speckle Metrology, ASM Handbook Volume 17, Nondestructive Evaluation and Quality Control, pp. 432–437. ASM International, OH, USA (1989) 2. Sirohi, R.S.: Speckle interferometry. Contemp. Phys. 43(3), 161–180 (2002) Shuichi Arikawa Degree: Doctor of Engineering from Yokohama National University; Position: Senior Assistant Professor; Affiliation: Department of Mechanical Engineering Informatics, School of Science and Technology, Meiji University; Interest: Material science, Solid mechanics, Optical measurement technique.
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