110 J. P. M. Hoefnagels et al. Fig. 14.3 The nano-tensile test methodology [3]: (a) Scanning electron micrograph of a free-standing tensile specimen that is fixed at one end along the perimeter of the anchor. At the free-standing gauge-end a gripping hole is made with load-centering feature. Along the substrate and the length of the beam several displacement tracking markers are fabricated to measure the substrate displacement and the gauge deformation. (b) Overview of the nano-tensile tester highlighting manual precision manipulators for angular alignment, coarse xyz-positioning and a xyz-piezo actuator for nm-positioning. (c) Nano-tensile stage placed in a FEI Quanta 600 ESEM. (Photo courtesy of Bart van Overbeeke Fotografie.) (d) Tensile creep experiment at constant stress (see inset) followed by time dependent anelasticity recorded for a tensile specimen
RkJQdWJsaXNoZXIy MTMzNzEzMQ==