84 C.Wu et al. 11.4 Conclusions The vectorial interfacial TSRs for silicon/epoxy interface were extracted directly and simultaneously for a wide range of mode-mix. A decoupled normal and shear TSRs were observed. The effect of epoxy deformation was also investigated. Acknowledgments The authors gratefully acknowledge funding of this work by Semiconductor Research Corporation. References 1. Wu, C., Gowrishankar, S., Huang, R., Liechti, K.M.: On determining mixed-mode traction–separation relations for interfaces. Int. J. Fract. (2016). doi:10.1007/s10704-016-0128-4 2. Wu, C.: Using far-field measurements for determining mixed-mode interactions at interfaces. Dissertation, The University of Texas at Austin (2016)
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